The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 12, 1994
Filed:
Jan. 22, 1992
Applicant:
Inventors:
Jeroen M Kettenis, Eindhoven, NL;
Laurens Doornhein, Eindhoven, NL;
Assignee:
U.S. Philips Corporation, New York, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03K / ; H03B / ;
U.S. Cl.
CPC ...
328167 ; 328163 ; 307520 ;
Abstract
An image is sampled at a given sampling frequency. For each original sample at least one additional sample delayed relative to the first sample is generated (12, 14, 16). The original samples are non-linearly processed (18) and the additional samples are non-linearly processed (20) independently of the processing (18) of the original samples. The output signals from the two processing stages are downsampled (22) back to the original sampling frequency and are metered if required for correcting the overall amplitude and phase vs. frequency characteristic.