The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 12, 1994
Filed:
Dec. 01, 1992
Kenneth E Prager, Los Angeles, CA (US);
Hughes Aircraft Company, Los Angeles, CA (US);
Abstract
An imaging system including a scanning linear detector array is calibrated with the aid of a source of radiation to provide uniformity in gain among the various detectors of the array. A first memory is provided for storing a map of the source obtained by a scanning through a succession of parallel line scans by means of a single one of the detectors, the detector array being offset between the successive line scans to enable the single detector to perform all of the line scans. A second memory is provided to store an image of the source provided by a scanning by all of the detectors along their respective scan lines. The data obtained in each line scan in each of the memories is averaged. Then, the average value for a scan line stored in the second memory is divided by the average value of the same scan line appearing in the first memory to provide a ratio for each scan line. The ratio is the gain of the detector of the scan line relative to the gain of the first detector. The mapping allows equalization of the gains for eliminating the effect of nonuniformities of the test source from the resultant calculation of the relative detector gains.