The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 12, 1994

Filed:

Sep. 27, 1991
Applicant:
Inventors:

Abdou F DeBan, Dayton, OH (US);

David M Tumey, Dayton, OH (US);

Jonathon W Reeves, Yellow Springs, OH (US);

David B McQuain, Dayton, OH (US);

William H Reeves, Spring Valley, OH (US);

Carole C Reeves, Spring Valley, OH (US);

Elias D Aboujaoude, Xenia, OH (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
128736 ; 36441303 ;
Abstract

The present invention relates to a device for detecting and monitoring physiological conditions in mammalian tissue, and method for using the same. The device includes sensors for sensing physiological conditions and generating signals in response thereto and processor operatively associated with the sensors for receiving and manipulating the signals to produce a generalization indicative of normal and abnormal physiological condition of mammalian tissue. The processor is characterized to include a neural network having a predetermined solution spaced memory, the solution space memory including regions indicative of two (2) or more physiological conditions, wherein the generalization is characterized by the signals projected into the regions.


Find Patent Forward Citations

DeBan, Abdou. (1994). Device for detecting cancerous and precancerous conditions in a breast (U.S. Patent No. 5301681). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5301681

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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