The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 05, 1994
Filed:
Apr. 29, 1992
Stephen V McKaughan, Arlington, MA (US);
Gary F Nevers, Lynn, MA (US);
Joseph W Landry, Saugus, MA (US);
John P Fallon, Andover, MA (US);
Paul R Adomaitis, Trafford, PA (US);
Aluminum Company of America, Pittsburgh, PA (US);
Abstract
Method and apparatus for inspecting the surface of a moving web of homogeneous material for anomalies, the apparatus including a light source for illuminating the web surface and a light sensitive detector for receiving data from the web surface. The data is representative of the light reflected from the surface, as the light is affected by surface anomalies and background information. Computational means are provided for receiving output data from the detector in response to the data the detector receives from the web surface, and for processing the output data in a manner that determines the presence of surface anomalies. The computation means includes a plurality of filters for transforming the surface data in a manner that effects substantial elimination of the background information, and means for establishing threshold levels for background information. In addition, automatic means is provided for modifying the threshold levels in response to changes in the reflectance, frequency, or contrast of background information received by the detector and forwarded to the computation means.