The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 05, 1994
Filed:
Oct. 31, 1990
Applicant:
Inventor:
Juichiro Ukon, Miyanohigashi, JP;
Assignee:
Horiba Ltd., Kyoto, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J / ; G01N / ;
U.S. Cl.
CPC ...
356326 ; 356 72 ;
Abstract
A microscopic spectrometer having a separate optical path for masking light from a sample for spectrometric measurements. In the preferred embodiment, a beam splitter is disposed behind an object lens to form two branched optical paths. One of the optical paths is provided with masks at a point of focus along the path, allowing part of the image to be masked. The second optical path allows optical throughput and observation of the entire image. These two optical paths are rejoined, and a final image is obtained for visual inspection by synthesizing the two optical paths.