The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 05, 1994

Filed:

Mar. 13, 1992
Applicant:
Inventors:

Tadahiko Maeda, Yokohama, JP;

Yoshiaki Tsukumo, Tokyo, JP;

Satoshi Yasuda, Kawasaki, JP;

Syuuichi Sekine, Urayasu, JP;

Shuichi Obayashi, Urayasu, JP;

Assignee:

Kabushiki Kaisha Toshiba, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01Q / ; G01R / ;
U.S. Cl.
CPC ...
343703 ;
Abstract

The present invention relates to an apparatus for measuring antenna radiation efficiency, wherein a random field measurement method can be adopted. In this apparatus, a to-be-measured antenna and a standard antenna are situated in a frame. In the frame, a plurality of rods, which are horizontally movable and extend vertically, are supported. A plurality of radio wave scatterers whose intervals and curvatures can be determined at random are held to the rods. In the frame, a random field is created by the radio wave scatterers.


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