The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 05, 1994
Filed:
Jul. 31, 1992
Applicant:
Inventor:
Sidney E Buttrill, Jr, Palo Alto, CA (US);
Assignee:
Varian Associates, Inc., Palo Alto, CA (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
B01D / ; H01J / ;
U.S. Cl.
CPC ...
250282 ; 250292 ;
Abstract
A method for improving sensivity of a QIT by overcoming deleterious space charge effects on the collection of higher mass ions in a QIT by rejecting residual air gas ions during ionization and by rejecting other ions during ionization employing a 1/m/z weighting of the amplitude of each secular frequency, where m/z is the mass to charge ratio of the ions.
Buttrill, Jr, Sidney. (1994). Quadruple ion trap method having improved sensitivity (U.S. Patent No. 5300772). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5300772
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile