The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 05, 1994
Filed:
Dec. 29, 1992
Jeffrey J Dahlin, Bothell, WA (US);
John F Holic, Jr, Seattle, WA (US);
William G Lundell, Redmond, WA (US);
Steven B Duke, Bothell, WA (US);
Jeffrey B Yim, Honolulu, HI (US);
Abbott Laboratories, Abbott Park, IL (US);
Abstract
A method and system for controlling the intervals during which light signals are sampled in a fiber-optic sensing system compensates for signal artifacts that are caused by movement of the fiber-optic waveguide during the sampling. The method and system sample the light signals at intervals that are shorter than the intervals during which displacement of the optical waveguide occurs in normal use. The short-sampling intervals result in the individual sampling of different wavelengths of light being exposed to the same changes in transmission characteristics of the optical waveguide which causes signal artifacts. Accordingly, when subsequent processing of the collected signals occurs, the effects of the signal artifacts are compensated for.