The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 05, 1994
Filed:
Apr. 21, 1992
Applicant:
Inventors:
Toshiaki Nakagawa, Tenri, JP;
Hisakazu Miyatake, Nara, JP;
Assignee:
Sharp Kabushiki Kaisha, Osaka, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
73 78 ; 73866 ;
Abstract
A method for evaluating performance of an aluminum alloy wiring film includes the steps of forming a first aluminum alloy film on a substrate, forming a second aluminum alloy film on another substrate, measuring hardness of the both films, and evaluating the superiority of stressmigration of the aluminum alloy films by comparison between the films in hardness.
Nakagawa, Toshiaki. (1994). Method for evaluating performance of aluminum alloy wiring film (U.S. Patent No. 5299450). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5299450
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile