The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 29, 1994
Filed:
Jan. 11, 1988
David C Reynolds, Boulder, CO (US);
Michael Wong, Longmont, CO (US);
International Business Machines Corporation, Armon, NY (US);
Abstract
Method for use in a CAD system whereby three-dimensional interferences among space-oriented objects can be rapidly determined by storing a reduced granularity of the design space in the form of a three-dimensional matrix having elements which represent identification numbers of objects which occupy the design space in the subcontinuum represented by the element. The element can be multidimensional or the element can refer to a table if more than one object occupies the associated subcontinuum. As objects are added to the drawing, the new objects are assigned unique index numbers which are stored in all the matrix elements corresponding to all the subcontinuums occupied by the object. Calculations for interference among pairs of objects need only be made between objects having their index number in a same element of the matrix.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile