The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 29, 1994

Filed:

Feb. 09, 1993
Applicant:
Inventors:

Hans-Jurgen Kuhn, Bernried, DE;

Horst Menzler, Bernried, DE;

Stephan Sattler, Peissenberg, DE;

Assignee:

Boehringer Mannheim GmbH, Mannheim, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; B23Q / ; B65H / ;
U.S. Cl.
CPC ...
436 43 ; 198399 ; 198400 ; 221167 ; 221173 ; 422 63 ; 422 99 ;
Abstract

Device for the positionally correct feeding of test strips to an analysis unit. The test strips 10 include a base layer and at least one raised test field fixed to one side of the base layer. The test strips are contained disordered with respect to their longitudinal axis rotation position in a storage container. A separation and position correcting device 1 serves to feed the test strips 10 individually one after the other in a defined position to the analysis unit. Simplicity of construction and reliable operation are achieved due to the fact that the separation and position correcting device 1 includes a position correcting stage 30 with two rolls, between which a narrow gap 35 exists. The rolls rotate so that the surface 31a of the first roll 31 moves in the region of the gap 35 from top to bottom, while the surface 32a of the second roll 32 moves from bottom to top. The first roll 31 includes peripheral raised webs 37 which are in alignment with test field-free regions of the test strips 10. The second roll 32 is provided with axially parallel running drivers 38. The width of the gap 35 in the region of the raised webs 37 is smaller than the thickness of the test strips including the test field.


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