The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 1994
Filed:
Sep. 09, 1991
Yoshitaka Bito, Kokubunji, JP;
Kensuke Sekihara, Musashimurayama, JP;
Ryuichi Suzuki, Kokubunji, JP;
Hitachi, Ltd, Tokyo, JP;
Hitachi Medical Corp., Tokyo, JP;
Abstract
This invention relates to a data processing method for suppressing truncation artifacts mixed into two-dimensional images in nuclear magnetic resonance imaging. Two-dimensional measurement data arrays are obtained on a space frequency domain by the combination of phase encoding and a readout gradient magentic field, and a data position providing the greatest value of the one-dimensional data array constituting the two-dimensional measurement data array is obtained in the readout direction so as to estimate the origin of the space frequency axis in the readout direction. A high-pass filter using the estimated origin as a reference is applied to each one-dimensional data array, and data extrapolation is made for each one-dimensional data array to obtain a data array having an expanded region. Nuclear spin images are obtained by inverse Fourier transformation of these data arrays.