The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 1994
Filed:
Feb. 27, 1992
Sei Murakami, Kudamatsu, JP;
Masao Takai, Kudamatsu, JP;
Ryusei Nakano, Kudamatsu, JP;
Nobuo Kimura, Kudamatsu, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
An inverted microscope is adapted so that a specimen thereon e.g. cells can be irradiated by a laser beam. The laser beam is guided from a laser source by a series of adjustably movable reflectors which introduce it into the microscope optical pathway at a parallel-beam region thereof, and through the objective lens of the microscope. A point to be irradiated can be selected by moving the reflectors which may be galvanometrically-movable. The laser beam can be focused together with the microscope image. The movable reflectors are kept within 200 mm behind the objective lens principal plane (PP) to ensure that the laser can be applied all over the microscope viewing field.