The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 1994
Filed:
Mar. 24, 1992
Hidehiko Furuhashi, Fujisawa, JP;
Nikon Corporation, Tokyo, JP;
Abstract
A high sensitivity microscope is applicable to observe a dark specimen image or an image of a specimen unsuitable for irradiation by strong illumination light, through the use of an image intensifier capable of being inserted into a viewing optical system. The viewing optical system comprises an objective and an eyepiece, and an image intensifier may be disposed in the viewing optical system such that an acceptance plane thereof is located at an image plane of the objective and such that an optical output plane thereof is conjugate with an image plane of the eyepiece. Also, an optical path switch mechanism may be provided to guide light from the objective selectively through an optical path including the image intensifier or through an optical path not including the image intensifier. Alternatively, the image intensifier or a relay lens may be selectively inserted into the viewing optical system.