The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 15, 1994

Filed:

Jul. 23, 1993
Applicant:
Inventors:

Eiichi Goto, Fujisawa, JP;

Yutaka Harada, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324248 ; 505846 ;
Abstract

A magnetometer comprising a superconducting loop including a magnetic flux detecting coil and a SQUID (Superconducting QUantum Interference Device) connected to the superconducting loop via magnetic flux. A negative inductance generating device is provided having two terminals for generating a negative inductance defined by the value of the derivative of generalized magnetic flux between the two terminals with current flowing between the terminals (d.PHI./dI) being negative. The inductance of the superconducting loop is decreased by the negative inductance generating device and input signals intensified by the negative inductance generating device are detected by the SQUID. A plurality of the superconducting loops may be provided to construct a gradiometer and a variable negative inductance generating device is provided to the respective superconducting loop to equalize and intensify the sensitivities of the detection coils.


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