The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 15, 1994

Filed:

Jul. 09, 1993
Applicant:
Inventors:

Dan Z Reinstein, New York, NY (US);

Ronald H Silverman, Brooklyn, NY (US);

Donald J Coleman, Haworth, NJ (US);

Frederic L Lizzi, Tenafly, NJ (US);

Assignees:

Cornell Research Foundation Inc., Ithica, NY (US);

Riverside Research Institute, New York, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
12866006 ;
Abstract

An ultrasound system that enables determination of layer thicknesses and contours of a multi-layer organic body includes a transmitter/receiver for obtaining a radio frequency signal from echoes over a plurality of points on the organic surface. Each radio frequency signal is then deconvolved to remove apparatus generated noise and filtered to create an analytic signal that exhibits a magnitude related to an instantaneous rate of arrival of total echo energy received by the transmitter/receiver. Analytic signals from adjacent parallel scans are then cross-correlated and magnitude detected to determine energy peaks to enable accurate determination of echo producing surfaces of each layer of the multi-layer organic body across the plurality of interrogation points. In the application of the invention to Corneal Epithelium Mapping, a pupil monitoring system is included that disables the measurement system if the pupil's gaze wanders so as to cause a diversion of the optical axis.


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