The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 08, 1994
Filed:
May. 08, 1991
Applicant:
Inventors:
Isao Hasegawa, Tokyo, JP;
Atsushi Takahashi, Tokyo, JP;
Assignee:
NEC Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ; G06F / ;
U.S. Cl.
CPC ...
371-3 ; 395575 ;
Abstract
The testing system is provided with a diagnostic processing apparatus which is independent from a computer to be tested. The diagnostic processing apparatus operates based on a clock signal which is separate from another clock signal used in the computer to asynchronously issue a fault generation command to the computer. The computer is provided with a register for storing particular fault mode information. The computer is responsive to the issued fault generation command for enabling the stored fault mode information so as to generate an asynchronous pseudo-fault in the computer for testing purpose.