The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 08, 1994
Filed:
May. 01, 1991
George L Booth, Ft. Collins, CO (US);
Hewlett-Packard Company, Palo Alto, CA (US);
Abstract
A method is described which increases the diagnostic resolution of a fault dictionary 130 used by automated test equipment (ATE) to determine a failed device in a unit under test 120. To achieve the goal of better diagnostic resolution, the method of the present invention first uses a combination of strategies to generate different fault syndromes. If all generated fault syndromes are not the same, then only 'possible' fault detection data in the fault dictionary 130 is then used to analyze the syndromes. If all fault syndromes are the same, then only 'hard' detection data in the fault dictionary is used to analyze the fault syndromes. Fault resolution is increased by treating the two categories of detection data separately, because there are fewer possible faults in each category than in the situation wherein both fault types are merged.