The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 08, 1994
Filed:
Oct. 06, 1983
Applicant:
Inventors:
Jay M Bernard, Torrance, CA (US);
Harold Mirels, Rolling Hills Estates, CA (US);
Eugene B Turner, Torrance, CA (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ; G01N / ; G01N / ;
U.S. Cl.
CPC ...
356124 ; 250572 ; 356237 ; 356445 ; 356447 ;
Abstract
The microreflectometer system, forming a 0.01 mm.sup.2 area spot, scans a mirror coating for defects of a mirror having a diameter of about 30 centimeters. Tens of thousands of reflectivity measurements are automatically taken as a computer controlled three dimension stage having the test mirror therein is selectively controlled. The reflectivity of each measurement either relative or absolute is used to determine the condition of the coating.
Bernard, Jay. (1994). Microreflectometer system (U.S. Patent No. 5293211). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5293211
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile