The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 08, 1994
Filed:
Sep. 04, 1992
Applicant:
Inventors:
Albert Jordan, Mountain View, CA (US);
Peter L Fu, Sunnyvale, CA (US);
David J Garcia, San Jose, CA (US);
Assignee:
Tandem Computers Incorporated, Cupertino, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
3241 / ; 371 221 ; 371 223 ;
Abstract
Disclosed is a circuit configuration that permits the monitoring of the operation of an input/output circuit of a digital unit under test by pseudo-random scan test techniques. A resistive element couples test signals to an input/output terminal of the device under test to which the input/output circuit is connected. The connection between the resistive element and the terminal is monitored during pseudo-random scan testing, permitting testing of the input/output circuitry.