The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 08, 1994

Filed:

Nov. 16, 1992
Applicant:
Inventors:

Kiyoyasu Hiwada, Kanagawa, JP;

Nobuyuki Kasuga, Tokyo, JP;

Assignee:

Hewlett-Packard Company, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03K / ; H03K / ; H03K / ; H03K / ;
U.S. Cl.
CPC ...
307260 ; 307269 ; 328 63 ; 328 72 ;
Abstract

A test waveform generator comprises a storage unit (1a , 1b) for storing timing information; a timing generator unit (2a, 2b) to which the timing information is input from the storage unit and which is adapted to output a timing pulse at a predetermined time on the basis of the timing information; and a waveform generating unit (3, 4) to which the pulse from the timing generator unit is input and which is adapted to output a test waveform. The timing generator unit is arranged so that the timing of the timing pulse is set with either (1) a period clock signal (CLK) serving as a reference or (2) another timing pulse serving as a reference.


Find Patent Forward Citations

Hiwada, Kiyoyasu. (1994). Method and apparatus for generating test waveforms to be applied to a (U.S. Patent No. 5293080). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5293080

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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