The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 01, 1994
Filed:
Nov. 13, 1992
Masayoshi Dehara, Tokyo, JP;
Ando Electric Co., Ltd., Tokyo, JP;
Abstract
An IC memory testing apparatus comprises a pattern generating circuit, a decision circuit, a first-in memory circuit which stores the defect data of a IC memory under test and simultaneously reads the resulting data. A latch circuit is also used to shorten the testing time. The resulting information about the defective cell of the tested IC memory is stored and read out during the test, with the memory circuit executing a storing operation for the address of defective cell data and simultaneously executing a reading operation for the data having been stored. The time periods required for the reading and writing operations are set independently of each other, and the operation frequency of the memory circuit is less than for testing the memory to be tested.