The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 01, 1994
Filed:
Jan. 28, 1992
Ernest P Esztergar, La Jolla, CA (US);
SGI International, La Jolla, CA (US);
Abstract
An instrument for measuring the properties of materials. This nondestructive, noncontacting instrument detects electromagnetic radiation from the materials across a wide range of the electromagnetic spectrum, and combines these diverse data so as to derive the material property values desired. In particular, the properties detectable through particle magnetic resonance, spectroscopy of light in the infrared-visible-ultraviolet range, and detection of x-ray and gamma ray radiation may be included in the instrument. Sensors detect each wavelength band of electromagnetic radiation, and data from all of these sensors is merged in a central data processor to evaluate the material properties of interest.