The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 01, 1994

Filed:

Aug. 07, 1992
Applicant:
Inventor:

Armin H Pfoh, New Berlin, WI (US);

Assignee:

General Electric Company, Milwaukee, WI (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
36441314 ; 36441313 ; 36441315 ; 36441316 ; 36441318 ; 36441319 ;
Abstract

An x-ray computed tomography system for helical scanning, translates a patient as projections of the patient at various beam angles are obtained and employs a detector array having multiple rows displaced along the direction of translation. The intensity signals from the multiple rows are combined to produce a composite projection having an improved beam profile along the translation direction. The composite projection is generated by adding together intensity signals obtained for detector elements in each column, at a given beam angle, and for related columns measuring rays having angles differing by x radians or an integer multiple thereof. The intensity signals are selected so that their points of acquisition cluster closely about the position of the desired slice plane.


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