The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 01, 1994
Filed:
Aug. 26, 1991
Akira Imao, Inazawa, JP;
Toyoda Gosei Co., Ltd., Nishikasugai, JP;
Abstract
A fatigue testing apparatus and method for applying stress to a sample, photographing the degree of fatigue of the sample, and making a material judgment. The sample is deformed by the application of stress thereto. The degree of fatigue of the sample is photographed and recorded as a still image in an intermittent photographing mode using an image photographing device. The photographing timing is synchronized with a peak of the stress applied to the sample. Since the sample deformation at the timing is large, the degree of fatigue of the sample can be photographed accurately. Consequently, it is no longer necessary for the operator in charge to visually check the condition during test such as fatigue test and it becomes possible to confirm cracks, etc. in a real-time manner after the test. Even fine cracks can be checked and so it is possible to make an exact judgment about the degree of fatigue of the sample.