The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 01, 1994
Filed:
Aug. 19, 1992
John W Juvinall, Ottawa Lake, MI (US);
Steven D Kistler, Toledo, OH (US);
James A Ringlien, Maumee, OH (US);
Owens-Brockway Glass Container Inc., Toledo, OH (US);
Abstract
Apparatus for measuring sidewall thickness of transparent containers that includes a source for directing a light beam onto the outer surface of the container sidewall at an angle such that a portion of the light beam is reflected from the outer sidewall surface, and a portion is refracted into the container sidewall, reflected from the inner sidewall surface and then re-emerges from the outer sidewall surface. A lens is disposed between a linear array light sensor and the container sidewall for focusing light energy reflected from the outer and inner sidewall surfaces onto the sensor. The lens has an image plane in which the sensor is disposed and an object plane co-linear with the light beam. Electronics is responsive to light energy incident on the sensor for determining wall thickness of the container between the inner and outer sidewall surfaces.