The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 01, 1994
Filed:
Oct. 17, 1991
Applicant:
Inventors:
Assignee:
Samsung Electronics Co., Ltd., Suweon, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ; G01R / ;
U.S. Cl.
CPC ...
3241 / ; 3241 / ;
Abstract
A chip-lifetime testing instrument for semiconductor devices which can detect defective chips by testing the performance and electrical lifetime of the chips in manufacturing process of the semiconductor devices, so that the manufacturing cost can be reduced and unnecessary processes for packaging of defective chips can be avoided, thereby reducing the necessary space for the set-up of the testing instrument.