The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 01, 1994
Filed:
Jan. 27, 1993
Applicant:
Inventors:
Mingda Wang, Walnut Creek, CA (US);
Edward G Marquette, Oakland, CA (US);
Assignee:
Varian Associates, Inc., Palo Alto, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01V / ;
U.S. Cl.
CPC ...
250292 ; 250282 ;
Abstract
An ion trap mass spectrometer system providing superposition of an AC dipole and/or monopole field on the quadrupole field to provide one preferential ejection direction.
Wang, Mingda. (1994). Ion trap mass spectrometer method and apparatus for improved sensitivity (U.S. Patent No. 5291017). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5291017
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile