The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 01, 1994
Filed:
Oct. 09, 1992
Mitsutoshi Tanaka, Saitama, JP;
Takaki Arai, Saitama, JP;
Takeshi Igarashi, Saitama, JP;
Kenichi Sawada, Saitama, JP;
Fuji Photo Film Co., Ltd., Kanagawa, JP;
Abstract
A dry analysis element which gives a calibration curve having a constant blank value for every lot and can be used without the need of correction of the internal calibration curve memorized in an analyzer. The dry analysis element including a water-permeable layer which contains: a reagent composition capable of producing an optically detectable substance in the presence of a predetermined analyte in an aqueous sample; and a fogging agent selected from the group consisting of the optically detectable substance and a material which is detectable by the same method for detecting the optically detectable substance. Also provided is a process for preparing the analysis element.