The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 22, 1994

Filed:

Jan. 28, 1993
Applicant:
Inventor:

Khanh C Nguyen, Whitehall Township, Lehigh County, PA (US);

Assignee:

AT&T Bell Laboratories, Murray Hill, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
371-51 ;
Abstract

A method is disclosed for determining the byte error rate (ByER) of a received digital signal. In particular, a local byte clock signal is generated and a complement of the received signal (or clock signal) is compared to the clock signal (or received signal). When both are the same logic value, as determined by a series of logic gates, an error is deemed to have occurred. The total number of errors N over a predetermined period of time T are then counted. The byte error rate is then determined from the relation ##EQU1##


Find Patent Forward Citations

Nguyen, Khanh. (1994). Method for determining byte error rate (U.S. Patent No. 5289473). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5289473

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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