The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 22, 1994
Filed:
Mar. 04, 1993
Applicant:
Inventors:
Jun Sawamura, Kanagawa, JP;
Tetsuzo Kuragano, Tokyo, JP;
Assignee:
Sony Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ; G05B / ;
U.S. Cl.
CPC ...
36447429 ; 318570 ;
Abstract
In a method for generating data defining the machining depth along a tool path, grid points are generated according to split points indicating a form of a model, and rough machining data for contour milling is generated according to the grid points, so that rough machining data which presents overcutting can be prepared. Contour points are generated and drilling points are set according to a comparison with cut planes so that the drilling points can be set easily and automatically. The contour points are retrieved successively so as to easily generate a tool path for contour milling.