The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 22, 1994
Filed:
Feb. 11, 1993
Maschinenfabrik Rieter AG, Winterthur, CH;
Abstract
A method and apparatus for converting measurement data pertaining to slivers and fibers originating from a continuous measurement that is dependent upon a plurality of parameters to calibration values. The plurality of parameters includes ambient, processing and measurement parameters. The parameters are converted and combined during processing. The resulting data relates only to individual property parameters and their changes per unit of time and are reduced to standard conditions with respect to ambient and processing parameters. The apparatus includes a plurality of sensors, a calibrating unit and a processing unit that function to continuously measure a quantity of material per length of the sliver and a variation in a fineness of the fiber per unit of time.