The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 22, 1994
Filed:
Jan. 26, 1993
Hubert Gramling, Ebersbach, DE;
Daimler-Benz AG, , DE;
Abstract
An integrated-optics extension interferometer, in which the measuring and reference arm, the beam splitter and the beam coupler as well as entrances and exits for primary light and interference light are integrated in the baseplate, can be applied in the manner of a wire strain gauge to components to be investigated. The portions of the waveguide which form the measuring and reference arm are integrated over their entire length in the baseplate, and are disposed in a plurality of loops with mutually parallel oriented straight active partial sections and intermediate deflecting sections, in which a coupling free mutual minimum spacing of all straight active partial sections and deflecting sections of the integrated waveguides forming the measuring and reference arm respectively is observed at all locations. As a result of this, the fundamental interferometer can be applied to the surface of stressed workpieces in a manner which is as simple and space-saving as a conventional electrical-resistance wire strain gauge for extension measurements. In order to achieve an automatic compensation of the extension due to temperature, the reference arm is also expediently wound in the manner of loops and is designed to be of the same length as the measuring arm, but is disposed in an extension-metrologically neutral manner. An integrated-optics extension interferometers of double-beam construction according to Michelson or according to Mach-Zehnder and those of so-called multibeam construction according to Fabry-Perot are possible.