The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 22, 1994
Filed:
Sep. 16, 1992
Applicant:
Inventors:
Khodor S Elnashar, Richardson, TX (US);
Jay T Cantrell, Dallas, TX (US);
Clarence D Lewis, Richardson, TX (US);
Assignee:
Texas Instruments Incorporated, Dallas, TX (US);
Primary Examiner:
Int. Cl.
CPC ...
H03B / ;
U.S. Cl.
CPC ...
307520 ; 307518 ; 307603 ; 328111 ;
Abstract
A glitch filter identifies and eliminates positive edge and negative edge glitches without utilizing a high frequency sampling clock. The glitch filter comprises a programmable delay buffer string, two multiple input AND gates and a latch. The buffer string provides a plurality of incrementally delayed signals and utilizes them as signal samples thus simulating a high frequency sampling clock. The two multiple input AND gates serve to eliminate positive or negative edge glitches. The latch outputs the accurate filtered data without any positive or negative edge glitches.