The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 15, 1994
Filed:
Sep. 03, 1991
John W Cuffe, State College, PA (US);
Alan D Weiner, New Bloomfield, PA (US);
Krautkramer-Branson, Incorporated, Lewistown, PA (US);
Abstract
Test apparatus (10) performs non-destructive testing of an object (O) to determine if it has flaws or defects. An ultrasonic wave (W) is generated and directed at the object. A return wave (R) reflected by the object is received and analyzed to determine if a flaw or defect. The return wave is converted to digital data which is stored for purposes of later analysis. For this purpose, digital signals containing the data are routed over a quiet bus (24). Digital signals are routed over the bus prior to generation of an ultrasonic wave to establish test parameters. Digital noise may occur during the transmission. A controller (22) controls routing of digital signals over the bus. The controller inhibits the flow of digital signals over the bus during that portion of an operational cycle of the apparatus during which the ultrasonic waves are produced and return waves evaluated. The controller allows transmission of digital signals over the bus at other times. As a result, the ultrasonic portion of the apparatus is effectively isolated from the bus so any digital noise thereon cannot effect the ultrasonic portion of the apparatus and the test results produced thereby.