The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 15, 1994
Filed:
Apr. 22, 1991
Klaus Hildebrand, Heerbrugg, CH;
Klaus-Peter Zimmer, Heerbrugg, CH;
Heinz Suhner, Rebstein, CH;
Juergen Metz, Balgach, CH;
Luitpold Schulz, Widnau, CH;
Leica Heerbrugg AG, Heerbrugg, CH;
Abstract
A microscope adapted for use by two or more operators during surgical operations has a main objective lens and at least two mutually independent stereoscopic observation beam paths. Each stereoscopic observation beam path has a magnification system and a focusing system disposed therein. Pupil displacement systems are provided in modular construction of different mechanical lengths but of equal optical path lengths. This modular construction allows individual and customized configurations of the microscope for adaptation to meet the needs and requirements of various operating conditions and the various operating disciplines.