The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 15, 1994

Filed:

Jan. 13, 1993
Applicant:
Inventors:

Joseph R Kinard, Darnestown, MD (US);

De-xiang Huang, Gaithersburg, MD (US);

Donald B Novotny, Bethesda, MD (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01C / ; H01C / ;
U.S. Cl.
CPC ...
338 24 ; 338307 ; 338310 ; 338322 ; 338329 ;
Abstract

Multilayer, thin film multijunction integrated micropotentiometers are formed in an integral multifilm membrane form over a through opening in a nonmagnetic, dielectric substrate. Through the use of conventional photolithographic and etching techniques, integrated structures are formed to include either single elongate heater elements, bifilar heater elements, or trifilar heater elements with multiple return paths. Multijunction thermopiles and resistors are formed with the heater. The individual layers of silicon oxide or silicon nitride, are formed with conventional chemical vapor deposition, sputtering and other known techniques.


Find Patent Forward Citations

Kinard, Joseph. (1994). Multilayer thin film multijunction integrated micropotentiometers (U.S. Patent No. 5287081). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5287081

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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