The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 15, 1994
Filed:
Nov. 04, 1991
Andrew Longacre, Jr, Skaneateles, NY (US);
Charles M Hammond, Jr, Skaneateles, NY (US);
William H Havens, Skaneateles, NY (US);
John M Pidhirny, Skaneateles, NY (US);
Welch Allyn, Inc., Skaneateles Falls, NY (US);
Abstract
A method and apparatus are provided for detecting bar-space and space-bar transitions in a bar code symbol. A sequence of sparsely sampled analog signals from a photodetector in a bar code scanner is representative of the reflectance pattern of a symbol. Following initialization, a threshold, representing the value of the analog signal at a transition point, is derived from observed samples of the bars and spaces in the bar code symbol. Sampled reflectance information is accumulated as the symbol is scanned, and a program driven microprocessor calculates and repeatedly updates this threshold, using observed maxima and minima in the analog samples, and also referencing a binary output to determine whether a bar or space is currently being viewed. When the values of two successive analog samples bracket this threshold, then a bar-space or space-bar transition has occurred. Linear interpolation is performed on the two samples to determine the transition point and an offset from the first of the two samples. After a delay corresponding to this offset, the level of a binary output is changed. A bit serial binary output is thus produced, representative of the relative widths of bars and spaces.