The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 08, 1994

Filed:

May. 24, 1993
Applicant:
Inventors:

Jae C Schwartz, Santa Clara County, CA (US);

John N Louris, Santa Clara County, CA (US);

Assignee:

Finnigan Corporation, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J / ;
U.S. Cl.
CPC ...
250282 ; 250291 ; 250292 ;
Abstract

A method is disclosed for operating an ion trap mass spectrometer in such a way as to distinguish resonantly ejected ions from non-resonantly ejected ions. A supplementary AC field is superimposed on the three-dimensional quadrupole trapping field and the combined fields are scanned to resonantly eject ions of consecutive mass-to-charge ratio. The ejected ions are detected and the output signal of the resonantly ejected ions has a frequency component at the frequency of the supplementary AC field.


Find Patent Forward Citations

Schwartz, Jae. (1994). Method of detecting ions in an ion trap mass spectrometer (U.S. Patent No. 5285063). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5285063

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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