The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 08, 1994
Filed:
Apr. 08, 1992
Mitoshi Fukumoto, Tokyo, JP;
Matsuzawa Seiki Kabushikikaisha, Tokyo, JP;
Abstract
In an indentation hardness tester a specimen placed on a specimen table is brought to a position just under an indenter mounted on one free end of a balance having its fulcrum received by a fulcrum bearing member, the balance is turned about the fulcrum by a test load to make an indentation in the specimen by the indenter and then the size of the indentation is measured through a microscope including an objective lens. The fulcrum bearing member for receiving the fulcrum of the balance is vertically movably mounted on a stationary part so that the indenter mounted on the balance is brought up from or down to a position right above the specimen table in close proximity thereto, and the microscope or at least its objective lens is pivotally mounted on the stationary part so that the objective lens turns to or turns away from a position right above the specimen table.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile