The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 01, 1994
Filed:
Dec. 31, 1991
Jerald B Dotson, Los Angeles, CA (US);
Jerry D Nease, Wilmington, NC (US);
Bruce W Reding, Elmira, NY (US);
Corning Incorporated, Corning, NY (US);
Abstract
A method for measuring the diameter of a transparent filament is provided which is substantially insensitive to ellipticity of the filament. The method comprises using an interference technique to measure the filament diameter at two locations which are spaced apart by an amount such that a plot of diameter versus angle of rotation for an elliptical filament calculated at the first location is approximately 90.degree. out of phase from the same plot calculated at the second location. Due to the phase difference, the average of the two measurements is substantially insensitive to ellipticity. For measurement apparatus comprising one laser and two detectors and for optical waveguide fibers having a cladding composed of fused silica, the two locations can be about 123.degree. apart. In other embodiments, a method for characterizing the non-circularity of a filament is provided. Apparatus for practicing the foregoing methods is also disclosed.