The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 01, 1994
Filed:
Oct. 15, 1990
Applicant:
Inventors:
Masamichi Tsukada, Ibaraki, JP;
Konosuke Oishi, Mito, JP;
Assignee:
Hitachi, Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J / ; G01J / ;
U.S. Cl.
CPC ...
356319 ; 356328 ;
Abstract
Incident slits and exit slits are provided separately on corresponding optical axes incident simultaneously on a spectroscope from a sample atomizing unit. A mechanism for changing the widths of the respective incident slits and exiting slits is provided such that the slit widths optimal to the respective elements to be measured are set on the corresponding optical axes to thereby realize high sensitivity analysis of all the elements to be measured simultaneously.
Tsukada, Masamichi. (1994). Multi-element simultaneous analysis atomic absorption spectroscopy (U.S. Patent No. 5283624). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5283624
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile