The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 25, 1994

Filed:

Jul. 24, 1991
Applicant:
Inventors:

Takaaki Terashita, Kanagawa, JP;

Keiko Yukawa, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03B / ;
U.S. Cl.
CPC ...
355 68 ; 355 77 ;
Abstract

Utilizing fuzzy theory, the exposure is determined based on an exposure operational formula defined for each of a plurality of previously classified patterns of a color original image. The color original image is divided into a multiplicity of portions for photometric purposes and, for the resulting photometric data, a plurality of features are evaluated. Utilizing fuzzy theory, a coincidence factor with a judging condition for judging the magnitude of the feature value is evaluated for each of the feature values. A coincidence factor for the pattern is evaluated from those coincidence factors to determine a weight for the pattern. Using this weight, a weighted mean of the exposures which is determined from the exposure operational formula is calculated to obtain a specific exposure.


Find Patent Forward Citations

Terashita, Takaaki. (1994). Method of determining an exposure for use in an image forming apparatus (U.S. Patent No. 5281995). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5281995

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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