The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 25, 1994
Filed:
Jun. 30, 1992
Ronghua Wei, Fort Collins, CO (US);
Paul J Wilbur, Fort Collins, CO (US);
Samuel C Wu, Lakewood, CO (US);
Other;
Abstract
Method and apparatus are provided for testing parts and materials in a controlled environment, especially an atomic oxygen environment. The apparatus includes a housing which has sample station located in its interior to receive a test sample. A contact element contacts a surface of the test sample, and a drive reciprocates the contact element so that the surface is subjected to wear along a wear path. At least one testing fluid is introduced and removed from the interior with the locations of introduction on removal preferably being such that the testing fluid flows across the test sample. The drive may be a carriage operated through the housing sidewall by a ferromagnetic coupling, and the sample station may be a turntable rotated by a ferromagnetic coupling. A second sample station may be included so that different wear path configurations are possible. The method includes the steps of placing a test sample on a sample support station, contacting the test sample with a contact element, isolating the interior of the housing from the ambient environment, introducing and removing at least one testing fluid at locations such that the testing fluid flows across the test sample, reciprocally moving the contact element on the test sample and measuring an amount of wear after a selected interval of time. Preferably, the test sample is rotated during reciprocation of the contact element. Temperature and pressure may be monitored and controlled.