The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 25, 1994
Filed:
Mar. 05, 1992
Patrick Peres, St. Medard en Jalles, FR;
Michel Cussac, La Teste, FR;
Aerospatiale Societe Nationale Industrielle, Paris, FR;
Abstract
Apparatus for testing testpieces (11) in the form of small plates, in which the testpiece is grasped between two pairs of jaws (12,13), which can be moved together. The jaws (12,13) are mounted on the platens (1,4) without hyperstaticity, which reduces the risks of introducing parasitic forces. The testpiece can be notched in such a way that its median portion is exposed to shear. The jaws then have adequate lengths to cover the principal faces of the testpiece (11) virtually up to the notches. The shear field is at a maximum and quasi-uniform in the median surface between the notches. This invention is useful for characterizing the interlaminar shear of plates made from composite materials and includes curved testpieces.