The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 18, 1994

Filed:

Oct. 23, 1992
Applicant:
Inventors:

Akira Tago, Tokyo, JP;

Haruhisa Madate, Yokohama, JP;

Masaaki Kobayashi, Kawasaki, JP;

Kazumasa Matsumoto, Yokohama, JP;

Yasuhiko Minakawa, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03B / ;
U.S. Cl.
CPC ...
378187 ; 378173 ; 378174 ;
Abstract

An X-ray phototaking apparatus for effecting an X-ray phototaking operation on a sheet film, selected from plural kinds of sheet film in close contact, under a reduced pressure, with an intensifying member selected from of plural kinds of intensifying members, is provided with a device for detecting at least either the kind of the intensifying member and the kind of the sheet film, and a device for varying at least one of the contact time of the intensifying member and the sheet film, the X-ray irradiating conditions and the exposure control parameters, based on detection signals obtained from the detection.


Find Patent Forward Citations

Tago, Akira. (1994). X-ray phototaking apparatus (U.S. Patent No. 5280514). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5280514

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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