The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 18, 1994

Filed:

Jun. 03, 1992
Applicant:
Inventors:

Hanns-Ingo Maack, Norderstedt, DE;

Ulrich Neitzel, Hamburg, DE;

Ingo Schafer, Kiel, DE;

Assignee:

U.S. Philips Corporation, New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03G / ;
U.S. Cl.
CPC ...
378 29 ; 378 28 ;
Abstract

The invention relates to an arrangement for producing X-ray images, which arrangement comprises an X-ray source (1) for the generation of an X-ray beam (10), a layer (41) sensitive to X-rays and situated on a cylindrical drum (4), and a read unit (5) for converting the X-ray image detected in the layer into electrical image values. In order to improve the X-ray images which can be produced by the arrangement an image processor (21) includes a module (212) for transforming the X-ray image (I) situated on the layer into an X-ray image (I.sub.v) situated in a virtual plane (12), and a module (211) for improving the uniformity of the modulation transfer function (MTF) over the X-ray image produced.


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