The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 18, 1994
Filed:
Nov. 19, 1991
Avner A Shaulov, Jerusalem, IL;
Rameshwar N Bhargava, Ossining, NY (US);
Donald R Dorman, Tarrytown, NY (US);
North American Philips Corporation, New York, NY (US);
Abstract
An improved AC susceptometer and methodology for its use which is particularly suitable for the characterization of the properties of superconducting materials. Added to the circuitry of a conventional AC susceptometer is frequency domain analytical equipment for measuring the induced magnetic response. The addition of frequency domain measuring equipment permits the determination of the harmonic components of the induced magnetic response. The measurement of the harmonic components of the response also provides novel methodology for studying the phenomena of flux penetration, flux pinning and movement and permits the measurement of parameters such as lower critical field, critical temperatures, and the irreversibility line.