The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 11, 1994

Filed:

Aug. 21, 1992
Applicant:
Inventor:

William L Luken, Jr, Ulster Park, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
395123 ; 395127 ; 395163 ;
Abstract

A method and apparatus for evaluating and rendering parametric surfaces. The apparatus includes a system memory connected to a graphics control processor, which is connected to local memory, and then connected in a pipelined arrangement to a plurality of parallel floating point processors, another floating point processor, a clipping processor and a frame buffer. The method includes: reading data from system memory and storing said data in local memory and/or registers within the graphics control processor; defining a control point stack containing kv by Nu transformed control points; multiplying the control points by a corresponding weight; evaluating the v dependence of homogeneous coordinates (wx,wy,wz,w) for successive parameter points separated by a v parameter interval; simultaneously within each parallel floating point processor evaluating the b-spline functions for one component of the coordinate set (wx,wy,wz,w) at successive u parameter points to obtain a top and bottom u coordinate, a top and bottom u derivative, and a top and bottom v derivative; eliminating the weight from each said coordinate yielding the geometric coordinates, and using the corresponding u and v derivatives to determine the geometric u and v tangents for a top and bottom point of an associated u value and therefrom the normal vector; clipping the polygon to the current viewing boundaries; and producing the shaded images of the polygon.


Find Patent Forward Citations

Luken, Jr, William. (1994). Parametric surface evaluation method and apparatus for a computer (U.S. Patent No. 5278948). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5278948

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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