The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 11, 1994

Filed:

Aug. 30, 1991
Applicant:
Inventors:

Cynthia A Adiano, Austin, TX (US);

Robert G Raines, Jr, Austin, TX (US);

Robert B Rowen, Round Rock, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ; G06F / ;
U.S. Cl.
CPC ...
364402 ; 395925 ;
Abstract

A system and method for linking Quality Function Deployment (QFD) data and actual process data is provided and uses a knowledge based expert system in combination with QFD principles to provide an interactive system capable of allowing dynamic changes to a manufacturing process in response to customer input regarding their requirements and ultimate satisfaction. The system expands upon a central element of QFD analysis, relationships between objects, by providing navigation and manipulation aids. Dynamic evaluation is possible and enables the detection of shifts in customer preference or needs. This is accomplished in part by remodeling the QFD House of Quality by enlarging it to accommodate additional matrices of data not previously associated with the QFD house. Further, a relational database is provided for correlating data about the manufacturing process and customer needs as well as new matrices, one of which maps product parameters to the customer data or the manufacturing process data. Another matrix identifies responsibility for control, or ownership of particular product parameters. Additionally, analysis methods and customer survey data can be identified by matrices added to the relational data-base.


Find Patent Forward Citations

Adiano, Cynthia. (1994). Dynamic manufacturing process control (U.S. Patent No. 5278751). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5278751

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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